STRUCTURAL ANALYSIS
Here you can find out, which Omicron instrument helps you to put the technique that interests you into practice.
STRUCTURAL ANALYSIS
STM
MFM
LEED
SPA-LEED
RHEED
SEM
STM/SEM
SNOM
Sample Preparation
Contact AFM
Lateral AFM
Force Distance AFM
Non Contact AFM
EFM
SKPM
Needle Sensor AFM
Low Energy Electron Diffraction (LEED)
MBE Systems
(Surface Science Systems)
SPM PROBE
(Dedicated for SPM)
RHEED 30
(Electron Sources)
RHEED 20
(Electron Sources)
SPA LEED
(Spot Profile Analysis)
MULTIPROBE ARUPS
(Dedicated for Spectroscopy)
MBD LEED
(LEED / AES)
MCP LEED
(LEED / AES)
SPECTALEED
(LEED / AES)
MULTIPROBE LT
(Dedicated for Low Temperatures)
MULTIPROBE HREELS
(Dedicated for Spectroscopy)
MULTIPROBE MXPS
(Dedicated for Spectroscopy)
Multi-Chamber System
(System Concept & Preparation Chamber Variations)
MULTIPROBE RM
(System Concept & Preparation Chamber Variations)
MULTIPROBE XP
(System Concept & Preparation Chamber Variations)
MULTIPROBE P
(System Concept & Preparation Chamber Variations)
MULTIPROBE S
(System Concept & Preparation Chamber Variations)
