STRUCTURAL ANALYSIS
Here you can find out, which Omicron instrument helps you to put the technique that interests you into practice.
STRUCTURAL ANALYSIS
STM
MFM
LEED
SPA-LEED
RHEED
SEM
STM/SEM
SNOM
Sample Preparation
Contact AFM
Lateral AFM
Force Distance AFM
Non Contact AFM
EFM
SKPM
Needle Sensor AFM
Contact Atomic Force Microscopy (Contact AFM)
SPM PROBE
(Dedicated for SPM)
MULTIPROBE Cryogenic
(Dedicated for Low Temperatures)
Large Sample Beam Defl. AFM
(Large Samples)
MULTIPROBE ARUPS
(Dedicated for Spectroscopy)
Cryogenic SFM
(Low Temperature Instruments)
Variable Temperature UHV SPM
(Variable Temperature Instruments)
UHV AFM/STM
(Room Temperature)
MULTIPROBE HREELS
(Dedicated for Spectroscopy)
MULTIPROBE MXPS
(Dedicated for Spectroscopy)
MULTIPROBE RM
(System Concept & Preparation Chamber Variations)
MULTIPROBE XP
(System Concept & Preparation Chamber Variations)
MULTIPROBE P
(System Concept & Preparation Chamber Variations)
MULTIPROBE S
(System Concept & Preparation Chamber Variations)
