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ESCA+
Fast & Reliable High Performance ESCA Analysis

Angle Resolved XPS of HfONSi
by ESCA+ and Omicron Thin-Film Technology

TOF - PEEM
Time & Energy Resolved Imaging

Electron Spectroscopy
Electron Spectroscopy for Your Chemical Analysis

New CASCADE Control System
New CASCADE Control System - for Automated ESCA Analysis

MATRIX SPM Control System & LT STM
Atom Manipulation @ 5 K with MATRIX SPM Control System & LT STM

Atomic Layer Deposition Equipped Cluster Tool
Atomic Layer Deposition Equipped Cluster Tool with Sunale^TM R-150 ALD Module by Picosun

EFM Product Range
'All Purpose' E - Beam Evaporators

Sunale^TM R-150 ALD Module
Sunale^TMR - 150 ALD Module

Made with Pioneering ALD Experience Since 1974

SPM Bolt-On
SPM Capabilities on Beamlines

The XA Series
VT STM & VT AFM XA

Chemical Analysis of ALD Deposited Films
Chemical Analysis of ALD Deposited Films

MULTISCAN Lab with UHV GEMINI Column
3 nm SEM, 5 nm SAM, STM & QPlus AFM

Qplus AFM Technology on Single Crystal NaCl(100)
Qplus AFM Technology on Single Crystal NaCl(100)

Chemical Analysis of ALD Deposited Films
By X-Ray Photoelectron Spectroscopy & ESCA+

FOCUS HV-CSA
HAXPES up to 15 keV

Stand-Alone MBE
From Small Samples up to 4“ Wafer

MBE & SPM & Spectroscopy
MBE meets Nanoanalytics

UHV NANOPROBE
Local Electrical Probing at the Nanoscale !

NanoSAM Lab
3 nm UHV SEM & 5 nm SAM NanoSAM Lab

NanoESCA
Imaging ESCA with 650 nm Resolution NanoESCA

EFM 6
True UHV MBE